List of Examples
Example 5.1: Measurements and Graphical Method Applied to an Interconnection with TTL Devices
Example 6.1: Point-to-Point Structure
Example 6.3: Two Coupled Lines with Linear Loads
Example 6.4: Two Coupled Traces with TTL Devices in a Point-to-Point Test Board Structure
Example 6.5: Two Coupled Lines in a Bus Test Board Structure
Example 6.6: Five Coupled Lines with Non-linear Loads
Example 7.1: Trace with 50 Ω Characteristic Impedance
Example 7.2: Signal Integrity in a Lossy Coaxial Cable
Example 7.3: Signal Integrity in a Lossy UTP Cable
Example 7.4: Eye Diagram of a 75m Unshielded Twisted-pair Cable Driven by an RS422 Device
Example 8.1: Switching Noise Simulations of Two Stripline and Microstrip Structures
Example 8.2: Test Board for Prediction of Power Bus Impedance by Several Methods
Example 8.3: Measurements and Simulations with Standard Buried Capacitance (SBC) Test Boards
Example 9.1: Computations and Measurements of a Clock Spectrum
Example 9.2: Calculations and Measurements of Emission Produced by P-Test Boards
Example 9.3: Calculations and Measurements of Emission from S-Test Boards
Example 9.4: Calculations and Measurements of Emission from A-Test Boards
Example 9.5: Calculations and Measurements of Emission from Multilayer SBC-Test Boards
Example 9.8: Calculations and Measurements of Emission from S-Test Boards with an Attached Cable
Example 9.9: Calculations and Measurements of Emission from A-Test Boards with an Attached Cable
Example 9.12: Measurements of Emission from a Shielded Rack Equipped with PCBs and Power Supply
Example 9.13: Calculations and Measurements of Radiated Emission from a Coaxial Cable
Example 9.14: Measurements of Radiation from UTP Cable Filtered with a Common-mode Choke
Example 9.16: Measurement of Radiated Emission Patterns from Telecommunication Equipment
Example 10.1: Computation of Transfer Impedance for Several Interconnection Structures
Example 10.3: Calculation of the Noise in a Connector with an ECL Device
Example 10.4: Calculation of Noise in a Connector using SPICE
Example 10.5: Measurements of Transfer Impedance for Three Test Connectors
Example 10.6: Measurements of Radiation from a Test Cable with a Pigtail
Example 10.7: Numerical Simulations of a Test Board with an Attached Cable
Example 10.8: S-parameter Measurements and Simulations of a Test Board with a Split
Example 10.9: S-parameter Measurements and Simulations of a Test Board with an Island
Example 11.1: Simulation of TDR Measurements Assuming a Trace in a PCB as the DUT
Example 11.2: Simulation of TDR Measurements Assuming aVia as the DUT
Example 11.3: Transmission-line Parameter Extraction of a Simple Connector
Example 11.4: Lumped-circuit Element Extraction of a Simple Via
Example 11.5: Radiated Emission Measurements from a Rack in Two Different Semi-anechoic Rooms
Example 11.6: Modeling a Radiating Loop in a Semi-anechoic Room
Example 12.1: LVDS Signal Integrity and Common-mode Rejection Investigation by Measurements