List of Tables
Table 2.1 |
The SI Base Units |
10 |
Table 3.1 |
Sources of Seismic Vibration and Corresponding Frequencies |
55 |
Table 3.2 |
Possible Sources of Very Low-Frequency Vibration |
56 |
Table 4.1 |
Gauge Block Classes According to ISO 3650 |
67 |
Table 4.2 |
The Quality Factor and Coherence Length of Some Light Sources |
72 |
Table 4.3 |
Effect of Parameters on Refractive Index |
87 |
Table 6.1 |
Minimum Distance Between Features for Different Objectives |
149 |
Table 6.2 |
Types of Unidimensional (Profile) Material Measures |
180 |
Table 6.3 |
Type of Bidimensional (Areal) Material Measures |
181 |
Table 7.1 |
Overview of Guidance Deviations, Transfer Artefacts to Be Used and Calibration Measurements |
217 |
Table 7.2 |
Examples of Surface Forces Commonly Encountered in AFM Measurement |
221 |
Table 7.3 |
Various Substances That Have Been Linked to AFM Tips or Cantilevers |
223 |
Table 8.1 |
Relationship Between Cut-Off Wavelength, Tip Radius (rtip) and Maximum Sampling Spacing |
248 |
Table 8.2 |
Relationships Between Nesting Index Value, S-filter Nesting Index, Sampling Distance and Ball Radius |
264 |
Table 8.3 |
Current Status of ISO 25178 Areal Specification Standards |
266 |
Table 8.4 |
Types of Scale-Limited Features |
276 |
Table 8.5 |
Criteria of Size for Segmentation |
276 |
Table 8.6 |
Methods for Determining Significant Features |
280 |
Table 8.7 |
Feature Attributes |
280 |
Table 8.8 |
Attribute Statistics |
281 |
Table 10.1 |
Summary of Surface Interaction Force Equations |
337 |
Table 10.2 |
Advantages and Disadvantages of Low-Force Production and Measurement Methods |
346 |
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