List of Tables

Table 2.1 The SI Base Units 10
Table 3.1 Sources of Seismic Vibration and Corresponding Frequencies 55
Table 3.2 Possible Sources of Very Low-Frequency Vibration 56
Table 4.1 Gauge Block Classes According to ISO 3650 67
Table 4.2 The Quality Factor and Coherence Length of Some Light Sources 72
Table 4.3 Effect of Parameters on Refractive Index 87
Table 6.1 Minimum Distance Between Features for Different Objectives 149
Table 6.2 Types of Unidimensional (Profile) Material Measures 180
Table 6.3 Type of Bidimensional (Areal) Material Measures 181
Table 7.1 Overview of Guidance Deviations, Transfer Artefacts to Be Used and Calibration Measurements 217
Table 7.2 Examples of Surface Forces Commonly Encountered in AFM Measurement 221
Table 7.3 Various Substances That Have Been Linked to AFM Tips or Cantilevers 223
Table 8.1 Relationship Between Cut-Off Wavelength, Tip Radius (rtip) and Maximum Sampling Spacing 248
Table 8.2 Relationships Between Nesting Index Value, S-filter Nesting Index, Sampling Distance and Ball Radius 264
Table 8.3 Current Status of ISO 25178 Areal Specification Standards 266
Table 8.4 Types of Scale-Limited Features 276
Table 8.5 Criteria of Size for Segmentation 276
Table 8.6 Methods for Determining Significant Features 280
Table 8.7 Feature Attributes 280
Table 8.8 Attribute Statistics 281
Table 10.1 Summary of Surface Interaction Force Equations 337
Table 10.2 Advantages and Disadvantages of Low-Force Production and Measurement Methods 346
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