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Library of Congress Cataloging-in-Publication DataSystem-on-chip test architectures: nanometer design for testability / edited by Laung-Terng Wang, Charles Stroud, and Nur Touba. p. cm. Includes bibliographical references and index. ISBN 978-0-12-373973-5 (hardcover : alk. paper) 1. Systems on a chip—Testing. 2. Integrated circuits—Very large scale integration—Testing.3. Integrated circuits—Very large scale integration—Design.I. Wang, Laung-Terng. II. Stroud, Charles E. III. Touba, Nur.TK7895.E42S978 2007621.39’5–dc22 2007023373
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