The editors would like to acknowledge many of their colleagues who helped create this book. Foremost are the 39 chapter/section contributors listed here. Without their strong commitments to contributing the chapters and sections of their specialty to the book in a timely manner, it would not have been possible to publish this book.
We also would like to thank the external contributors and reviewers for providing invaluable materials and feedback to improve the contents of this book. We wish to thank Alexandre de Morais Amory (UFRGS, Porto Alegre, Brazil), Dr. Jean-Marie Brunet (Mentor Graphics, Wilsonville, OR), Prof. Erika Cota (UFRGS, Brazil), C. Grecu (University of British Columbia, Canada), Dr. Vikram Iyengar (IBM, Burlington, VT), Dr. Ming Li (Siemens, Shanghai, China), Ke Li (University of Cincinnati), Dr. Lars Liebmann (IBM, Yorktown Heights, NY), Erik Jan Marinissen (NXP Semiconductors, Eindhoven, The Netherlands), Prof. David Pan (University of Texas, Austin, TX), Dr. Anuja Sehgal (AMD, Sunnyvale, CA), Jing Wang (Texas A&M University), Zheng Wang (Texas A&M University), Lei Wu (Texas A&M University), and Prof. Dan Zhao (University of Louisiana) for their contributions of materials, exercises, and figures to the book. We also wish to thank Prof. R. D. Shawn Blanton (Carnegie Mellon University), Prof. Erika Cota (UFRGS, Brazil), Prof. R. Dandapani (University of Colorado at Colorado Springs), Prof. Joan Figueras (University Politècnica de Catalunya, Spain), Prof. Dimitris Gizopoulos (University of Piraeus, Greece), Prof. Yinhe Han (Chinese Academy of Sciences, China), Claude E. Shannon Prof. John P. Hayes, (University of Michigan), Prof. Shi-Yu Huang (National Tsing Hua University, Taiwan), Prof. Sungho Kang (Yonsei University, Korea), Prof. Erik Larsson (Linköping University, Sweden), Prof. James C.-M. Li (National Taiwan University, Taiwan), Prof. Subhasish Mitra (Stanford University), Prof. Kartik Mohanram (Rice University), Prof. Saraju P. Mohanty (University of North Texas), Prof. Nicola Nicolici (McMaster University, Canada), Prof. Sule Ozev (Duke University), Prof. Partha Pande (Washington State University), Prof. Ian Papautsky (University of Cincinnati), Prof. Irith Pomeranz (Purdue University), Prof. Kewal K. Saluja (University of Wisconsin, Madison), Prof. Li-C. Wang (University of California, Santa Barbara), Prof. H.-S. Philip Wong (Stanford University), Prof. Tomokazu Yoneda (Nara Institute of Science and Technology, Japan), Prof. Xiaoyang Zeng (Fudan University, China), Dr. Florence Azais (LIRMM, Montpellier, France), Dr. Jayanta Bhadra (Freescale, Austin, TX), Dr. Yi Cai (Agere, Allentown, PA), Dr. Jonathan T.-Y. Chang (Intel, Santa Clara, CA), Karthik Channakeshava (Virginia Tech), Dr. Li Chen (Intel, Hillsboro, OR), Dr. Bernard Courtois (CMP, Grenoble, France), Frans de Jong (NXP Semiconductors, Eindhoven, The Netherlands), Dr. Avijit Dutta (University of Texas, Austin), Herbert Eichinger (Infineon Technologies, Villach, Austria), François-Fabien Ferhani (Stanford University), Dr. Anne Gattiker (IBM, Austin, TX), Dhiraj Goswami (Mentor Graphics, Wilsonville, OR), Dr. Xinli Gu (Cisco, San Jose, CA), Dr. Dong Hoon Han (Texas Instruments, Dallas, TX), Dr. Mokhtar Hirech (Synopsys, Mountain View, CA), Tushar Jog (WiQuest, Allen, TX), Dr. Rohit Kapur (Synopsys, Mountain View, CA), Dr. Brion Keller (Cadence Design Systems, Endicott, NY), Dr. Haluk Konuk (Broadcom, Santa Clara, CA), Dr. Ajay Kumar (Texas Instruments, Dallas, TX), Dr. Christian Landrault (LIRMM, Montpellier, France), Dr. Ming Li (Siemens, Shanghai, China), Dr. Richard (Rick) Livengood (Intel, Santa Clara, CA), Dr. Shih-Lien Lu (Intel, Hillsboro, OR), Dr. Anne Meixner (Intel, Hillsboro, OR), Dr. Anurag Mittal (ARM, Sunnyvale, CA), Anandshankar S. Mudlapur (Intel, Folsom, CA), Dr. Benoit Nadeau-Dostie (LogicVision, Ottawa, Canada), Phil Nigh (IBM, Essex Junction, VT), Dr. Harry Oldham (ARM, Cambridge, United Kingdom), Peter O’Neill (Avago Technologies, Fort Collins, CO), Praveen K. Parvathala (Intel, Chandler, AZ), Jie Qin (Auburn University), Dr. Phil Reiner (Stanley Associates, Huntsville, AL), John Rogers (Harris, Melbourne, FL), Dr. Yasuo Sato (Hitachi, Tokyo, Japan), Rajarajan Senguttuvan (Georgia Institute of Technology), Masashi Shimanuchi (Credence, Milpitas, CA), Dr. Peilin Song (IBM, Yorktown Heights, NY), Michael Spica (Intel, Boise, ID), Dr. Franco Stellari (IBM, Yorktown Heights, NY), Derek Strembicke (AEgis Technologies Group, Huntsville, AL), Dr. Kun-Han Tsai (Mentor Graphics, Wilsonville, OR), Dr. Pramod Variyam (WiQuest, Allen, TX), Dr. Erik H. Volkerink (Verigy, Cupertino, CA), Dr. Seongmoon Wang (NEC Labs, Princeton, NJ), Dr. Yuejian Wu, (Nortel, Ottawa, Canada), Dr. Takahiro Yamaguchi (Advantest, Japan), Shrirang Yardi (Virginia Tech), Dr. Qing Zhao (Texas Instruments, Dallas, TX), and all chapter/section contributors for cross-reviewing the manuscript. Special thanks also go to many colleagues at SynTest Technologies (Sunnyvale, CA), including Dr. Ravi Apte, Boryau (Jack) Sheu, Dr. Zhigang Jiang, Zhigang Wang, Jianping Yan, Johnson Guo, Xiangfeng Li, Fangfang Li, Feng Liu, Yiqun Ding, Lizhen Yu, Ginger Qian, Jiayong Song, Jim Ma, Sammer Liu, Jongjoo Park, Jinwoo Cho, Paul Hsu, Karl Chang, Yi-Chih Sung, Tom Chao, Josef Jiang, Brian Wang, Renay Chang, and Teresa Chang who helped review the manuscript, solve exercises, develop lecture slides, and draw figures and tables.
The editors are indebted to many colleagues at Elsevier (Burlington, MA) who have been very helpful and patient with us during the preparation and production of this book, in particular, the senior acquisitions editor Charles B. Glaser; copyeditor Karen Carriere; senior production editor Dawnmarie Simpson; and associate editor Michele Cronin. Finally, we would like to acknowledge the generosity of SynTest Technologies (Sunnyvale, CA) for allowing Elsevier to put an exclusive version of the company’s most recent VLSI testing and DFT software on the Elsevier companion Web site (www.books.elsevier.com/companions) for readers to use in conjunction with the book to become acquainted with DFT practices.