List of Contributors

Carmen Aracil,     Universidad de Sevilla, Seville, Spain

Semih Aslan,     Texas State University, San Marcos, TX, United States

Sandra Bermejo,     Polytechnic University of Catalonia, Barcelona, Spain

Cristian Dudescu,     Technical University of Cluj-Napoca, Cluj-Napoca, Romania

Vikram Chaturvedi,     Delft University of Technology, Delft, The Netherlands

Zheng J. Chew,     University of Exeter, Exeter, United Kingdom

Jaeyong Choi,     Sungkyunkwan University(SKKU), Suwon, Republic of Korea

Suzanne J.A.G. Cosijns,     ASML, Veldhoven, The Netherlands

Francisco J. Delgado,     University of Seville, Seville, Spain

Alessandro Depari,     University of Brescia, Brescia, Italy

David Dubuc,     University of Toulouse, Toulouse, France

Corina Birleanu,     Technical University of Cluj-Napoca, Cluj-Napoca, Romania

Alessandra Flammini,     University of Brescia, Brescia, Italy

Juan García,     University of Seville, Seville, Spain

Boby George,     Indian Institute of Technology (IIT) Madras, Chennai, India

Spenser Gilliland,     Illinois Institute of Technology, Chicago, IL, United States

Jean-Claude Golinval,     University of Liège, Liège, Belgium

Alexander Gottwald,     Physikalisch-Technische Bundesanstalt, Berlin, Germany

Katia Grenier,     University of Toulouse, Toulouse, France

Han Haitjema,     Mitutoyo Research Center Europe, Best, The Netherlands

Ali Heidary

Delft University of Technology, Delft, The Netherlands

Guilan University, Rasht, Iran

Smartec, Breda, The Netherlands

Jacopo Iannacci,     Fondazione Bruno Kessler, Trento, Italy

Maarten J. Jansen,     ASML, Veldhoven, The Netherlands

Giacomo Langfelder,     Politecnico di Milano, Milan, Italy

Sukhan Lee,     Sungkyunkwan University(SKKU), Suwon, Republic of Korea

Lijie Li,     Swansea University, Swansea, United Kingdom

Antonio Luque,     Universidad de Sevilla, Seville, Spain

Gerard C.M. Meijer

Delft University of Technology, Delft, The Netherlands

SensArt, Delft, The Netherlands

Mohammad R. Nabavi,     Delft University of Technology, Delft, The Netherlands

Stoyan Nihtianov,     Delft University of Technology, Delft, The Netherlands

Pablo R. Ortega,     Polytechnic University of Catalonia, Barcelona, Spain

Erdal Oruklu,     Illinois Institute of Technology, Chicago, IL, United States

Francisco Perdigones,     Universidad de Sevilla, Seville, Spain

Marius Pustan,     Technical University of Cluj-Napoca, Cluj-Napoca, Romania

José M. Quero,     Universidad de Sevilla, Seville, Spain

Ferran Reverter,     Universitat Politècnica de Catalunya - BarcelonaTech, Castelldefels, Spain

Blas Salvador,     Universidad de Sevilla, Seville, Spain

Jafar Saniie,     Illinois Institute of Technology, Chicago, IL, United States

Kseniia Sapozhnikova,     D.I. Mendeleyev Institute for Metrology, Saint Petersburg, Russia

Frank Scholze,     Physikalisch-Technische Bundesanstalt, Berlin, Germany

Anoop C. Sreekantan,     Indian Institute of Space Science and Technology (IIST), Thiruvananthapuram, India

Roald Taymanov,     D.I. Mendeleyev Institute for Metrology, Saint Petersburg, Russia

Alessandro Tocchio,     Politecnico di Milano, Milan, Italy

Marcos Turqueti,     Illinois Institute of Technology, Chicago, IL, United States

Johan G. Vogel,     Delft University of Technology, Delft, The Netherlands

Guijie Wang

Delft University of Technology, Delft, The Netherlands

Smartec, Breda, The Netherlands

Sha Xia,     NXP Semiconductors, Eindhoven, The Netherlands

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