Chapter 22

Statistical Process Control

Abstract

This chapter discusses control charts as an important tool of statistical process control (SPC). They may be divided into two major groups: control charts for variables and control charts for attributes. Among the control charts for variables, we will study the control charts for the mean (ˉXsi1_e), for the range (R), and for the standard deviation (S). Among the control charts for attributes, we will study the p chart (defective fraction), the np chart (number of defective products), the c chart (total number of defects per unit), and the u chart (average number of defects per unit). Finally, to measure the process capability, we will study the main indexes: Cp, Cpk, Cpm, and Cpmk.

Keywords

Control charts for variables; Control charts for attributes; Control charts for the mean (ˉXsi1_e); Control charts for the range (R); Control charts for the standard deviation (S); p chart; np chart; c chart; u chart; Process capability indexes

In God we trust. All others must bring data.

W. Edwards Deming

22.1 Introduction

Statistical process control (SPC) has been widely used to improve productivity, reducing the waste of inputs and rework, and, consequently, diminishing costs and increasing production capability. For Montgomery (2013), SPC is a set of tools used for solving problems whose main objective is to measure, monitor, control, and improve process quality. Control charts are an important SPC tool. They are used to assess process variability throughout time and to indicate whether the process is in control or not.

A process is in control when the variation in the product quality characteristics is only a result of random causes. These causes are inherent to the process (not identifiable), and they do not affect the product quality characteristics.

A process is out of control when the variation in the product quality characteristics or in the level of defects is a result of special causes that can be corrected or eliminated. This process variation is an anomaly, significantly impacting product quality characteristics, which requires an immediate intervention.

These special causes of variation can be a result of several factors, such as, ambient temperature, poor lighting, lack of equipment adjustments and maintenance, operators’ physical and mental fatigue, lack of training, quality of raw materials, etc.

The line chart presented in Section 3.2.1 in Chapter 3 is used to show the data evolution or trend of a quantitative variable at regular intervals. This chart can be used in process control to verify the evolution of the process mean throughout time.

Control charts can be divided into two major groups: control charts for variables, in which the quality characteristic is measured in a quantitative scale, and control charts for attributes, in which the quality characteristic is measured in a qualitative scale.

22.2 Estimating the Process Mean and Variability

Let X be a random variable that represents the quality characteristic, being normally distributed with a mean μ and with a known standard deviation σ, that is, X ~ N(μσ). In practice, since we usually do not know μ and σ, they must be estimated from samples or subgroups.

Thus, we must define the sampling method and the sample size. For Gomes (2010), the samples must be drawn from homogeneous batches formed by items produced by the same machine, operator and plant. According to the author, there is no predefined rule regarding the sample size, because it will depend on the production volume, on the inspection costs, and on how important the information obtained is.

The number of samples collected is represented by m, whose values usually vary between 20 and 30. Each sample contains n observations, whose values are small and are usually between 4 and 6.

For a certain sample i with n elements, its sample mean (ˉXisi8_e) is given by:

ˉXi=nj=1ˉXijn

si17_e  (22.1)

where Xij is the j-th element of the i-th sample or subgroup. and its sample range (ˉRisi18_e) is:

ˉRi=XmaxiXmini

si19_e  (22.2)

so, ˉXisi8_e follows a normal distribution with a mean μ and a standard deviation σˉXisi21_e, that is, ˉXi~N(μ,σˉXi)si22_e, such that:

E(ˉXi)=μ

si23_e  (22.3)

Var(ˉXi)=σ2n

si24_e  (22.4)

σˉXi=σn

si25_e  (22.5)

Assume that m samples are collected, each one of them containing n observations of the quality characteristic to be investigated. Therefore, the mean of the sample or subgroup means and the mean of the sample ranges are given by:

̿X=mi=1ˉXim

si26_e  (22.6)

ˉR=mi=1Rim,respectively,

si27_e  (22.7)

where:

  • ˉXi=si28_e mean of the i-th sample or subgroup;
  • ̿X=si29_e mean of the sample means;
  • m = number of samples;
  • n = number of observations for each sample;
  • Ri = range of the i-th sample or subgroup;
  • ˉR=si30_e mean of the sample ranges.

Consequently, we can use ̿Xsi6_e as an estimate for μ and ˉR/d2si32_e as an estimate for σ, as we will see in the following section.

22.3 Control Charts for Variables

Control charts for variables, also known as Shewhart control charts, are used when the product quality characteristic is measured in continuous values, such as, temperature, length or width, weight, volume, concentration, etc.

In this case, it is necessary to monitor the average value and also the variability in the quality characteristic. To control the process mean, control charts for the mean (ˉXsi1_e) are used. To monitor process variation, we have the control charts for the range (R) or the control charts for the standard deviation (S). Control charts for R are more commonly used to measure process variation (Montgomery, 2013).

Control charts for variables were developed by Shewhart aiming at detecting the presence of special causes in the variation of a certain process. Thus, if the process is under statistical control, future observations can be based on previous observations. For example, the graphical representation of a series of data is temporally plotted and the points plotted are compared to the control limits calculated previously. Hence, if one of these points is outside the control limits, this may indicate that the process is not in statistical control, that is, the control parameter has changed (Pylro, 2008).

22.3.1 Control Charts for ˉXsi34_e and R

22.3.1.1 Control Charts for ˉXsi1_e

Let X be a random variable that represents the quality characteristic with a normal distribution, mean μ, and a known variance σ2, that is, X ~ N(μσ2). Considering m samples of size n, the mean of the sample means is given by ̿Xsi6_e. Therefore, we have:

Z=̿Xμσ/n~N(0,1)

si37_e  (22.8)

that is, variable Z follows a standard normal distribution.

The probability of variable Z assuming values between − zα/2 and zα/2 is 1 − α, so:

P(zα/2Zzα/2)=1α

si38_e  (22.9)

or:

P(zα/2̿Xμσ/nzα/2)=1α

si39_e  (22.10)

Therefore, the confidence interval for μ is:

P(̿Xzα/2σnμ̿X+zα/2σn)=1α

si40_e  (22.11)

In statistical process control, we usually adopt zα/2 = 3, so, the control limits for ˉXsi1_e can be specified as:

UCL=ˉˉX+3σnCl=ˉˉXLCL=ˉˉX3σn

si42_e  (22.12)

where:

  • UCL: Upper Control Limit;
  • CL: Center Line;
  • LCL: Lower Control Limit.

These limits are also called three sigma control limits. The terms Upper and Lower Control Limits are also known as Upper Specification Limit (USL) and Lower Specification Limit (LSL). Fig. 22.1 shows the probability distribution of the mean and the confidence interval of 99.74% used as limits in the control charts.

Fig. 22.1
Fig. 22.1 Probability distribution of the mean and confidence intervals. (Source: http://www.portalaction.com.br/probabilidades/62-distribuicao-normal.)

In practice, since we do not know σ, we must estimate it. According to Sharpe et al. (2015), for normally distributed data, in which we do not have any other estimate of the standard deviation, we can use the relationship between the sample range i (Ri) and its standard deviation (σi), represented by the random variable W, called relative range:

W=Riσi

si43_e  (22.13)

The mean of the distribution of W is a constant called d2 that depends on the sample size and its values can be found in Table O in the Appendix. By using this constant, the standard deviation estimator ˆσisi44_e is given by:

ˆσi=Rid2

si45_e  (22.14)

Considering m samples of size n, the mean of the sample ranges is given by ˉRsi7_e (Expression 22.7), and the sample standard deviation estimator can be written as:

ˆσ=ˉRd2

si47_e  (22.15)

Thus, the control limits for ˉXsi1_e (Expression 22.12) start to be:

UCL=ˉˉX+3ˉRd2nCL=ˉˉXLCL=ˉˉX3ˉRd2n

si49_e  (22.16)

The term 3d2nsi50_e can be substituted for A2, which is a constant that depends only on the sample size (n) and its values can be found in Table O in the Appendix.

UCL=ˉˉX+A2ˉRCL=ˉˉXLCL=ˉˉXA2ˉR

si51_e  (22.17)

22.3.1.2 Control Charts for R

According to Sharpe et al. (2015) and Montgomery (2013), the procedure for R control charts is very similar to the ˉXsi1_e charts. The difference is that, in this case, we need to estimate the standard deviation for the range (σR).

The parameters of the R chart with the 3 sigma control limits are given by:

UCL=ˉR+3σRCL=ˉRLCL=ˉR3σR

si53_e  (22.18)

In practice, since we do not know σR, we must estimate it. Assuming that the quality characteristic is normally distributed, ˆσRsi54_e can be calculated from the distribution of the relative range W = R/σ. The standard deviation of W, known as d3, is a constant that depends on the sample size (n). Given that:

R=

si55_e

the standard deviation of the range (σR) is given by:

σR=d3σ

si56_e  (22.19)

Since σ is unknown, we can use Expression (22.15) to estimate it, so:

ˆσR=d3ˉRd2

si57_e  (22.20)

Thus, the control limits for R (Expression 22.18) start to be:

UCL=ˉR+3d3ˉRd2CL=ˉRLCL=ˉR3d3ˉRd2

si58_e  (22.21)

Defining that:

D3=13d3d2si59_e and D4=1+3d3d2si60_e, Expression (22.21) is reduced to:

UCL=D4ˉRCL=ˉRLCL=D3ˉR

si61_e  (22.22)

The values of constants D3 and D4 can be found in Table O in the Appendix for several values of n.

Example 22.1

The manufacturing process of a bookshelf is carried out by cutting steel sheets to produce the shelves, supports, and legs. The quality characteristic to be evaluated is the thickness of the steel sheet to make the shelves, measured in mm. Hence, 25 samples were used, each one of them with 5 observations, as shown in Table 22.E.1. The time interval between the samples or subgroups is 1 hour. Check and see if the process is in control by using the ˉXsi1_e and R charts.

Table 22.E.1

Measurements of the Steel Sheet Thickness in mm
SampleMeasurements
m1m2m3m4m5
114.2514.3714.7813.9814.12
213.8714.1214.7614.4413.85
313.5414.1214.8715.1214.17
415.0714.5114.8715.2214.24
513.4814.3214.6513.6713.94
613.8813.9613.7514.4714.83
714.2214.3615.1215.3614.78
814.2514.9814.5515.3715.12
914.7413.8713.8514.3114.55
1014.7714.6514.8915.4715.07
1115.1215.1714.8514.3515.02
1213.4813.7414.3814.2713.99
1313.7814.1214.5714.6713.58
1414.5715.1215.3715.1114.73
1514.7614.5515.3415.4415.21
1614.7614.2214.3014.9715.32
1715.1014.8514.6214.5015.35
1814.6814.2714.8715.3115.46
1914.3614.6413.8713.6514.12
2013.8713.9814.6514.5914.25
2114.7114.3514.6715.3315.12
2213.4713.8114.2614.5414.37
2314.3814.9715.2715.0915.07
2414.1714.6714.3213.4213.69
2515.2415.0414.8714.6514.88

Unlabelled Table

Solution

To specify the control limits, initially, we have to calculate each sample’s mean and range (ˉXisi8_e and Ri). After that, we have to calculate the mean of the sample means and the mean of the sample ranges:

̿X=25i=1ˉXi25=363.5425=14.54

si64_e

ˉR=25i=1Ri25=24.6825=0.99

si65_e

These calculations are shown in detail in Table 22.E.2.

Table 22.E.2

Calculating ̿Xsi6_e and ˉRsi7_e
SampleMeasurements
m1m2m3m4m5ˉXisi8_eRi
114.2514.3714.7813.9814.1214.300.80
213.8714.1214.7614.4413.8514.210.91
313.5414.1214.8715.1214.1714.361.58
415.0714.5114.8715.2214.2414.780.98
513.4814.3214.6513.6713.9414.011.17
613.8813.9613.7514.4714.8314.181.08
714.2214.3615.1215.3614.7814.771.14
814.2514.9814.5515.3715.1214.851.12
914.7413.8713.8514.3114.5514.260.89
1014.7714.6514.8915.4715.0714.970.82
1115.1215.1714.8514.3515.0214.900.82
1213.4813.7414.3814.2713.9913.970.90
1313.7814.1214.5714.6713.5814.141.09
1414.5715.1215.3715.1114.7314.980.80
1514.7614.5515.3415.4415.2115.060.89
1614.7614.2214.3014.9715.3214.711.10
1715.1014.8514.6214.5015.3514.880.85
1814.6814.2714.8715.3115.4614.921.19
1914.3614.6413.8713.6514.1214.130.99
2013.8713.9814.6514.5914.2514.270.78
2114.7114.3514.6715.3315.1214.840.98
2213.4713.8114.2614.5414.3714.091.07
2314.3814.9715.2715.0915.0714.960.89
2414.1714.6714.3213.4213.6914.051.25
2515.2415.0414.8714.6514.8814.940.59
Sum363.5424.68
Mean14.540.99

Unlabelled Table

From Table O in the Appendix, we can determine the values of constants A2 = 0.577, D3 = 0 and D4 = 2.114 of the control limits for ˉXsi1_e and R, considering n = 5.

Hence, the control limits for ˉXsi1_e by using Expression (22.17) can be written as:

UCL=̿X+A2ˉR=14.5417+0.557×0.9872=15.1111

si68_e

CL=̿X=14.5417

si69_e

LCL=̿XA2ˉR=14.54170.557×0.9872=13.9722

si70_e

On the other hand, the control limits for R by using Expression (22.22) are:

UCL=D4ˉR=2.114×0.9872=2.0874

si71_e

CL=ˉR=0.9872

si72_e

LCL=D3ˉR=0.0000

si73_e

The control charts for ˉXsi1_e and R will be generated by using Stata and SPSS software, as shown in Figs. 22.2, 22.3, 22.8, and 22.9.

Fig. 22.2
Fig. 22.2 ˉXsi1_e control charts on Stata for the process in Example 22.1.
Fig. 22.3
Fig. 22.3 R control charts on Stata for the process in Example 22.1.

The R charts (Figs. 22.3 and 22.9) indicate that the process variation is in control. The same is not true in relation to the process mean. We can observe, from the ˉXsi1_e control charts (Figs. 22.2 and 22.8), that there is one sample outside the control limits, providing strong evidence that the process mean changed due to the presence of special causes.

The presence of special causes can also be verified if the sequence of points in the chart is nonrandom (a trend, changes in the mean, seven consecutive points above or below the center line, or seven ascending or descending consecutive points).

Before investigating a special cause, it would be interesting to verify if there were any problems in the measuring system or an error when plotting the point. If these errors are not found, the company must revise its process and eliminate the special causes, making the process stable.

Solution by Using Stata Software

The data in Example 22.1 are available in the file Example_22.1.dta. To construct the ˉXsi1_e chart on Stata, we have to use the following command:

xchart varlist [if] [in] [, xchart_options]

The variables in this example were called m1, m2, m3, m4, and m5. If we only type the command xchart followed by the name of the variables, a scatter plot will be constructed. To connect the points in the chart, it is necessary to include the option connect(l), which will generate the following command:

xchart m1-m5, connect(l)

The same logic applies to the R chart starting from the command rchart:

rchart varlist [if] [in] [, rchart_options]

Therefore, we must type the following command:

rchart m1-m5, connect(l)

Conversely, the ˉXsi1_e and R charts can be obtained jointly by using Stata software, through the command shewhart:

shewhart m1-m5, connect(l)

Figs. 22.2 and 22.3 show the control charts for ˉXsi1_e and R, respectively, which were obtained on Stata.

Solution by Using SPSS Software

The data in Example 22.1 are available in the file Example_22.1.sav. The first column represents the sample or subgroup under analysis. The observations that correspond to each sample are listed sequentially in the second column, a variable called Thickness, as shown in Fig. 22.4.

Fig. 22.4
Fig. 22.4 Compilation of the data from Example 22.1 on SPSS.

So, we must click on AnalyzeQuality ControlControl Charts..., select, in Variables Charts, the option X-bar, R, s, define the variables we are interested in, and click, in Charts, on the options X-bar using range and Display R chart, as shown in Figs. 22.5, 22.6 and 22.7.

Fig. 22.5
Fig. 22.5 Procedure for constructing the control charts on SPSS.
Fig. 22.6
Fig. 22.6 Selecting the option Variables Charts on SPSS.
Fig. 22.7
Fig. 22.7 Defining the variables and selecting the ˉXsi1_e and R control charts on SPSS.

Figs. 22.8 and 22.9 show the control charts for ˉXsi1_e and R, respectively, which were obtained from SPSS software.

Fig. 22.8
Fig. 22.8 ˉXsi1_e control chart on SPSS for the process in Example 22.1.
Fig. 22.9
Fig. 22.9 R control chart on SPSS for the process in Example 22.1.

22.3.2 Control Charts for ˉXsi34_e and S

Even though the ˉXsi1_e and R control charts are commonly used, depending on the case, it could be more interesting to use the standard deviation chart (S) to monitor the process’s dispersion. One advantage of the R chart is its simplicity and how easy it is to apply it. On the other hand, the S chart is more precise, since it considers all the data in each sample and not only the maximum and minimum values as the R chart. Therefore, the standard deviation is a more efficient measure of variation than the range, mainly for large samples (n > 10).

Constructing the ˉXsi1_e and S control charts is similar to the ˉXsi1_e and R charts, the only difference lies in the equations used to calculate the control limits.

For a certain sample i with n elements, its sample standard deviation (Si) is given by:

Si=ni=1(XiˉX)2n1

si84_e

Assuming that m samples were collected, each one of them containing n observations of the quality characteristic, the mean of the sample or subgroup means and the mean of the sample standard deviations are given by:

̿X=mi=1ˉXim

si85_e

ˉS=mi=1Sim,respectively

si86_e

The control limits for the mean (ˉXsi34_e) are calculated as:

UCL=ˉˉX+A3ˉSCL=ˉˉXLCL=ˉˉXA3ˉS

si88_e  (22.23)

Constant A3 can be found in Table O in the Appendix for several different values of n.

And the control limits for the standard deviation (S) are given by:

UCL=B4ˉSCL=ˉSLCL=B3ˉS

si89_e  (22.24)

Constants B3 and B4 can also be found in Table O in the Appendix for several different values of n.

Example 22.2

The production of strawberry seedlings is widespread in many Brazilian regions with temperate and subtropical climate. They can be used for in natura consumption or in manufacturing processes. The variable being analyzed is the crown diameter (mm). Hence, 20 samples were used, each one of them with 4 observations, as shown in Table 22.E.3. The time interval between the samples or subgroups is 30 minutes. Check and see if the process is in control by using the ˉXsi1_e and S charts.

Table 22.E.3

Measurements of the Crown Diameter and mm
SampleMeasurements
m1m2m3m4
18.628.128.448.33
28.108.278.658.48
38.648.598.878.96
49.018.879.229.15
59.149.088.878.74
69.249.419.379.52
79.059.128.878.69
88.568.748.458.72
98.458.148.248.53
108.488.978.648.45
118.898.699.039.15
129.249.349.099.41
139.259.429.369.65
148.759.218.838.42
158.478.688.498.68
169.019.249.369.48
179.228.768.948.86
189.149.549.369.51
198.508.978.658.72
208.278.348.478.41

Unlabelled Table

Solution

To specify the control limits, initially, we have to calculate each sample’s mean and standard deviation (ˉXisi8_e and Si). After that, we have to calculate the mean of the sample means and the mean of the sample standard deviations:

̿X=20i=1ˉXi20=117.1520=8.86

si92_e

ˉS=20i=1Si20=3.6420=0.18

si93_e

These calculations are shown in detail in Table 22.E.4.

Table 22.E.4

Calculating ̿Xsi6_e and ˉSsi10_e
SampleMeasurements
m1m2m3m4ˉXisi8_eSi
18.628.128.448.338.380.21
28.108.278.658.488.380.24
38.648.598.878.968.770.18
49.018.879.229.159.060.16
59.149.088.878.748.960.19
69.249.419.379.529.390.12
79.059.128.878.698.930.19
88.568.748.458.728.620.14
98.458.148.248.538.340.18
108.488.978.648.458.640.24
118.898.699.039.158.940.20
129.249.349.099.419.270.14
139.259.429.369.659.420.17
148.759.218.838.428.800.32
158.478.688.498.688.580.12
169.019.249.369.489.270.20
179.228.768.948.868.950.20
189.149.549.369.519.390.18
198.58.978.658.728.710.20
208.278.348.478.418.370.09
Sum177.153.64
Mean8.860.18

Unlabelled Table

From Table O in the Appendix, we can determine the values of constants A3 = 1.628, B3 = 0, and B4 = 2.266 of the control limits for ˉXsi1_e and S, considering n = 4.

Therefore, the control limits for ˉXsi1_e by using Expression (22.23) can be written as:

UCL=̿X+A3ˉS=8.8574+1.628×0.1822=9.1539

si96_e

CL=̿X=8.8574

si97_e

LCL=̿XA3ˉS=8.85741.628×0.1822=8.5608

si98_e

On the other hand, the control limits for S by using Expression (22.24) are:

UCL=B4ˉS=2.266×0.1822=0.4128

si99_e

CL=ˉS=0.1822

si100_e

LCL=B3ˉS=0

si101_e

ˉXsi1_e and S control charts will be generated by using SPSS and are not available on Stata.

Solution by Using SPSS Software

The data in Example 22.2 are available in the file Example_22.2.sav and can be seen in Fig. 22.10.

Fig. 22.10
Fig. 22.10 Compilation of the data in Example 22.2 on SPSS.

Similar to Example 22.1, we must click on AnalyzeQuality ControlControl Charts..., select, in Variables Charts, the option X-bar, R, s and define the variables we are interested in. However, in Charts, we must select the options X-bar using standard deviation and Display s chart, as shown in Fig. 22.11.

Fig. 22.11
Fig. 22.11 Defining the variables and selecting the ˉXsi1_e and S control charts on SPSS.

Figs. 22.12 and 22.13 show the control charts for ˉXsi1_e and S, respectively, which were obtained from SPSS software.

Fig. 22.12
Fig. 22.12 ˉXsi1_e control chart on SPSS for the process in Example 22.2.
Fig. 22.13
Fig. 22.13 S control chart on SPSS for the process in Example 22.2.

The S charts indicate that the process variation is in control. The same is not true in relation to the process mean. From the ˉXsi1_e control charts, we can see that there are several samples outside the control limits, which suggests that the process is not in statistical control, that is, the process mean has changed.

22.4 Control Charts for Attributes

The Shewhart charts presented in the previous section are used to monitor process quality characteristics represented by quantitative variables. However, in several different cases, process quality is represented by a qualitative variable, usually with two categories (a binary variable): conforming and nonconforming items.

22.4.1 P Chart (Defective Fraction)

In many cases, the quality characteristic to be monitored is the proportion of defective items (p). If this proportion has increased, we must investigate the special causes for this variation and adjust the process. The proportions control chart is called p chart.

Consider the random variable D that represents the number of defective units in n observations. The proportion of defective items is given by p = D/n. As studied in Section 6.6.3 in Chapter 6, D follows a binomial distribution with parameters n and p, that is, D ~ b(n, p). The mean and the variance of D are given by:

E(D)=np

si105_e  (22.25)

Var(D)=np(1p)

si106_e  (22.26)

As the sample size increases, the binomial probability distribution becomes more similar to a normal distribution. The notation ˆpsi107_e represents an estimate of the real value of p. Thus, the probability distribution of ˆpsi107_e is normal with the mean and variance defined by:

E(ˆp)=p

si109_e  (22.27)

Var(ˆp)=p(1p)n

si110_e  (22.28)

When the proportion of nonconforming items (p) is known, 3σ control limits for p are established:

UCL=p+3p(1p)nCL=pLCL=p3p(1p)n

si111_e  (22.29)

when p is unknown, its value must be estimated from the data observed, considering a period in which the process is in control. These values are used to monitor future data. Analogous to the ˉXsi1_e control charts, to calibrate the data and calculate the control limits for p, m samples are collected, each one of them containing n observations of the quality characteristic. If there are Di nonconforming units in sample i, the fraction of nonconforming items in the i-th sample is given by:

ˆpi=Din,i=1,,m

si113_e  (22.30)

The average proportion of defective items in these m samples (ˉpsi114_e) is given by:

ˉp=mi=1ˆpim=mi=1Dimn

si115_e  (22.31)

The ˉpsi114_e statistic is an estimate of p, so, the control limits of 22.29 become:

UCL=ˉp+3ˉp(1ˉp)nCL=ˉpLCL=ˉp3ˉp(1ˉp)n

si117_e  (22.32)

In some cases, depending on the values of p and n, the lower control limit can be negative (LCL < 0). In these cases, we have to use LCL = 0 and assume that the control charts only have upper limits (Montgomery, 2013).

Example 22.3

Steel sheets with higher mechanical resistance are being used to manufacture several car parts, such as, wheels, bumpers, and other body parts. In a certain process, we tried to verify if the steel sheets produced met the quality characteristics required. In order to do that, 25 samples were collected, each one of them with 60 observations, and the number of defective steel sheets for each sample was verified, as shown in Table 22.E.5. The time interval between the samples or subgroups is 2 hours. Check and see if the process is in statistical control.

Table 22.E.5

Data on the Number of Defective Steel Sheets in Example 22.3
Sample NumberNumber of Steel SheetsNumber of Defective ItemsProportion of Defective Items
16060.100
26070.117
36050.083
46030.050
56070.117
66080.133
76060.100
86050.083
96050.083
1060100.167
116080.133
126070.117
136090.150
1460110.183
156090.150
166040.067
176080.133
186060.100
196070.117
206080.133
216080.133
2260110.183
2360100.167
246040.067
256060.100
Total1,500178

Unlabelled Table

Solution

We have m = 25 samples and n = 60 observations for each sample.

The proportion of defective sheets for each sample is presented in Table 22.E.5. Therefore, the average proportion of defective steel sheets for these 25 samples (ˉpsi114_e) is calculated as:

ˉp=0.100+0.117++0.10025=0.1187

si119_e

or:

ˉp=mi=1Dimn=17825×60=0.1187

si120_e

By applying Expression (22.32) of the control limits to ˉpsi114_e, we have:

UCL=0.1187+30.1187(0.8813)60=0.2439

si122_e

CL=0.1187

si123_e

LCL=max(0.11873330.1187(0.8813)60,0)=0

si124_e

Solution by Using Stata Software

To construct the p chart on Stata, we have to use the following command:

pchart reject_var unit_var ssize_var [, pchart_options]

The data in Example 22.3 are available in the file Example_22.3.dta. The first variable, called sample, represents each one of the 25 samples being analyzed. The second column refers to the variable rejects, which computes the total number of defective parts for each sample. Finally, the variable ssize represents the number of steel sheets in each sample that, in this case, is 60. Hence, the command to be typed to construct the p chart on Stata is:

pchart rejects sample ssize

Fig. 22.14 shows the p chart obtained on Stata.

Fig. 22.14
Fig. 22.14 p Chart on Stata for the process in Example 22.3.

Solution by Using SPSS Software

The data in Example 22.3 are available in the file Example_22.3.sav. The first column represents the sample or subgroup under analysis. The total number of defective parts for each sample is listed in sequence order in the second column, called rejects, as shown in Fig. 22.15. The third column, called ssize, is optional, since in the cases in which the sample sizes are constant, its respective value can be defined on the SPSS screen, as shown in Fig. 22.18.

Fig. 22.15
Fig. 22.15 Compilation of the data in Example 22.3 on SPSS.

So, we must click on AnalyzeQuality ControlControl Charts..., define the option p, np in Attribute Charts and the option Cases are subgroups in Data Organization, select the variables of interest, and click on p (Proportion nonconforming) in Chart, as shown in Figs. 22.16, 22.17, and 22.18. Also in Fig. 22.18, in Sample Size, we must select the option Constant and define the value 60. Another alternative is to select the option Variable and insert the variable ssize, as shown in Fig. 22.19. By clicking on OK, we obtain the p chart on SPSS, as shown in Fig. 22.20.

Fig. 22.16
Fig. 22.16 Procedure for constructing the p chart on SPSS.
Fig. 22.17
Fig. 22.17 Selecting the option p, np in Attribute Charts on SPSS.
Fig. 22.18
Fig. 22.18 Defining the variables and selecting the p control chart on SPSS.
Fig. 22.19
Fig. 22.19 Selecting the variable ssize in Sample Size.
Fig. 22.20
Fig. 22.20 p Control chart on SPSS for the process in Example 22.3.

We can verify through Fig. 22.20 that the process is in statistical control, since there are no points outside the control limits.

22.4.2 np Chart (Number of Defective Products)

Instead of using the proportion of defective items, the control chart can be based on the number of defective products(D = np), being called np control chart (np chart). Different from the p chart, this chart requires that the samples have the same size. Thus, the interpretation of the np chart is simpler when compared to the p chart.

When p is known, the control limits for np can be specified as:

UCL=np+3np(1p)CL=npLCL=np3np(1p)

si125_e  (22.33)

Otherwise, we use ˉpsi114_e as an estimate of p:

UCL=nˉp+3nˉp(1ˉp)CL=npˉpLCL=nˉp3nˉp(1ˉp)

si127_e  (22.34)

Analogous to the p chart, the lower control limit for the np chart can also be negative. In these cases, we have to use LCL = 0.

Example 22.4

From the data in Example 22.3, construct the np chart and check if the process is in control.

Solution

We have n = 60 and ˉp=0.1187si128_e, as calculated in the previous example.

By applying Expression (22.34) of the control limits to nˉpsi129_e, we have:

UCL=60×0.1187+360×0.1187(0.8813)=14.6350

si130_e

CL=60×0.1187=7.1200

si131_e

LCL=max(60×0.1187360×0.1187(0.8813),0)=0

si132_e

Stata does not offer the np chart. Therefore, Example 22.4 will only be solved on SPSS.

Solution by Using SPSS

Open the file Example_22.3.sav. Constructing the np chart follows the same logic as the p chart. Once again, click on AnalyzeQuality ControlControl Charts..., define the option p, np in Attribute Charts and the option Cases are subgroups in Data Organization. Once again, select the variables of interest, the sample size and, this time, click on the option np (Number of nonconforming) in Chart, as shown in Fig. 22.21. By clicking on OK, we obtain the np chart on SPSS, as shown in Fig. 22.22.

Fig. 22.21
Fig. 22.21 Constructing the np chart on SPSS.
Fig. 22.22
Fig. 22.22 Result of the np chart on SPSS.

Through Fig. 22.22, we can confirm that the process is in statistical control, since there are no points outside the control limits.

22.4.3 C Chart (Total Number of Defects per Unit)

In many situations, in addition to classifying the product as conforming or nonconforming, we are also interested in counting the number of defects per unit inspected. Thus, while the p chart controls the number of defective units, the c chart assesses the number of defects per unit inspected. As examples of application, we can mention the number of stains on a piece of clothing, the number of scratches on a piece of glass, the number of defects per steel sheet, etc. This chart requires that the samples observed have a constant size.

As presented in Section 5.3.7 in Chapter 5, consider a random variable X that represents the number of defects (k) in a certain unit of time, area, etc. Random variable X follows the Poisson distribution with parameter λ ≥ 0, called X ~ Poisson(λ), and its probability function is given by:

P(X=k)=eλλkk!,k=0,1,2,

si133_e  (22.35)

In the Poisson distribution, the mean and the variance of X are represented by parameter λ, that is, E(X) = Var(X) = λ. Therefore, the c chart with 3σ control limits can be specified as:

UCL=λ+3λCL=λLCL=λ3λ

si134_e  (22.36)

If the standard deviation is unknown, we have to use ˉλsi135_e as an estimate of λ, which represents the average number of defects observed in the m samples in the units inspected. Each sample consists of n inspection units and λi represents the number of defects in the i-th sample, such that:

ˉλ=1mmi=1λi

si136_e  (22.37)

And the control limits of 22.36 are rewritten as:

UCL=ˉλ+3ˉλCL=ˉλLCL=ˉλ3ˉλ

si137_e  (22.38)

If the lower control limit is negative, we use LCL = = 0.

Example 22.5

An electrical appliance company wants to control the quantity of small, nonapparent defects in a certain coffee maker. For a sample with 30 coffee makers, the number of defects per coffee maker was computed, as shown in Table 22.E.6. Construct the c chart for these data.

Table 22.E.6

Number of Defects per Coffee Maker
Coffee Maker NumberDefects per Coffee MakerCoffee Maker NumberDefects per Coffee Maker
12160
20176
35182
46194
57208
63213
70224
81239
942411
102254
115266
127275
138283
146291
154303

Unlabelled Table

Solution

For this example, each sample consists of a single inspection unit (n = 1). The average number of defects observed in the 30 samples is given by:

ˉλ=12930=4.3

si138_e

The control limits for ˉλsi135_e from Expression (22.38) can be specified as:

UCL=4.3+34.3=10.5209

si140_e

CL=4.3

si141_e

LCL=max(4.334.3,0)=0

si142_e

Solution by Using Stata Software

To construct the c chart on Stata, we have to use the following command:

cchart defect_var unit_var [, cchart_options]

The data in Example 22.5 are available in the file Example_22.5.dta. The first variable, called sample, represents each one of the 30 samples being analyzed. The second column refers to the variable defects, which computes the total number of defects per coffee maker. Hence, the command to be typed to construct the c chart on Stata is:

cchart defects sample

Fig. 22.23 shows the c chart obtained on Stata.

Fig. 22.23
Fig. 22.23 C Chart on Stata for the process in Example 22.5.

Solution by Using SPSS

Open the file Example_22.5.sav. Constructing the c chart follows the same logic as the p and np charts. Once again, click on AnalyzeQuality ControlControl Charts...; however, this time, define the option c, u in Attribute Charts and the option Cases are subgroups in Data Organization, as shown in Fig. 22.24. Once again, select the variables of interest, the sample size and click on the option c (Number of nonconformities) in Chart, as shown in Fig. 22.25. By clicking on OK, we obtain the c chart on SPSS, as shown in Fig. 22.26.

Fig. 22.24
Fig. 22.24 Selecting the c chart on SPSS.
Fig. 22.25
Fig. 22.25 Constructing the c chart on SPSS.
Fig. 22.26
Fig. 22.26 Result of the c chart on SPSS for the data in Example 22.5.

Through Fig. 22.25, we can see that it is not necessary to select the variable sample in Subgroups Labeled by, since the sample size is constant and was specified as 30 in Sample Size. Fig. 22.26 shows that there is one point above the upper control limit, indicating that the process is not in statistical control.

22.4.4 U Chart (Average Number of Defects per Unit)

This chart is an alternative to the c chart when the samples do not have the same size. It can also be used when the sample is made up of only one unit; however, it has several components that must be inspected as, for example, an engine.

When the inspection of the product uses 100% of its production, the sample size per period usually varies, making it difficult to interpret the c chart. In this case, the u chart is an alternative.

To construct the u chart, we have to select m samples. Consider λi the number of defects and ni the number of units inspected in the i-th sample. For each sample i, the number of defects per unit inspected is given by:

ui=λini

si143_e  (22.39)

The average number of defects per unit inspected is given by:

ˉu=mi=1λimi=1ni

si144_e  (22.40)

In the case of samples with constant sizes, the average number of defects per unit could also be calculated as mi=1ui/msi145_e.

The parameters of the u control charts can be specified as:

UCL=ˉu+3ˉuniCL=ˉuLCL=ˉu3ˉuni

si146_e  (22.41)

If the lower control limit is negative, we have to use LCL = 0.

Example 22.6

A toy company wishes to control the number of small defects in 100% of a type of scooter it produces. Each day, they select the amount of scooters produced and compute the number of defects per sample, as shown in Table 22.E.7. Construct the u control chart to monitor the process.

Table 22.E.7

Number of Defects per Scooter
Sample iSample Size (ni)Defects per Sample (λi)ui = λi/ni
12002401.20
22503001.20
32002201.10
42502601.04
53003601.20
63003601.20
72002701.35
82503001.20
93003001.00
103003301.10
112502801.12
122002601.30
132503201.28
143003421.14
153003101.03
162503101.24
172503701.48
183004601.53
192502701.08
202002901.45
Sum51006152

Unlabelled Table

Solution

By using Expression (22.40), the average number of defects per scooter is:

ˉu=61525100=1.206

si147_e

Since the samples are not the same size, the control limits must be calculated for each sample by using Expression (22.41), as shown in Table 22.E.8.

Table 22.E.8

Calculating the Control Limits for Example 22.6
Sample iSample Size (ni)UCL = ˉu+3ˉunisi12_eLCL = ˉu3ˉunisi13_e
12001.4390.973
22501.4150.998
32001.4390.973
42501.4150.998
53001.3971.016
63001.3971.016
72001.4390.973
82501.4150.998
93001.3971.016
103001.3971.016
112501.4150.998
122001.4390.973
132501.4150.998
143001.3971.016
153001.3971.016
162501.4150.998
172501.4150.998
183001.3971.016
192501.4150.998
202001.4390.973

Unlabelled Table

The u chart will be generated by using SPSS and it is not available on Stata.

Solution on SPSS

Open the file Example_22.6.sav. Constructing the u chart follows the same logic as the c chart. Once again, click on AnalyzeQuality ControlControl Charts..., choose the option c, u in Attribute Charts one more time, and the option Cases are subgroups in Data Organization, as shown in Fig. 22.24. Select the variables of interest and click on the option u (Nonconformities per unit) in Chart, as shown in Fig. 22.27. Notice that, different from the c chart, we must select the option Variable in Sample Size and insert the variable sample_size. By clicking on OK, we obtain the u chart on SPSS, as shown in Fig. 22.28.

Fig. 22.27
Fig. 22.27 Constructing the u chart on SPSS.
Fig. 22.28
Fig. 22.28 Result of the u chart on SPSS for the data in Example 22.6.

Fig. 22.28 suggests that the number of defects per scooter in sample 9 is below the lower control limit, while in samples 17, 18, and 20, the numbers are above the upper limits, indicating that the process is not in statistical control.

22.5 Process Capability

The control charts described in Sections 22.3 and 22.4 are used to verify process adjustment and stability, indicating the presence or absence of special causes. This section discusses the capability of a process to produce conforming items, according to the specifications of the project.

The capability of a process can be defined as its inherent capacity to produce identical items, for a long period of time and under certain conditions.

Based on Montgomery (2013) and Gonçalez and Werner (2009), to measure process capability, we will study the main indexes: Cp, Cpk, Cpm, and Cpmk. These indexes compare the output of the real process to the specification limits for the quality characteristic analyzed, demonstrating if the process is manufacturing products within the specification range. To use these indexes, it is necessary for the process to be in statistical control.

22.5.1 Cp Index

The Cp index relates the allowed variability in the process (specified in the project) to the natural variability of the process, and it is calculated as:

Cp=UCLLCL6σ

si148_e  (22.42)

where:

  • UCL: Upper Control Limit;
  • LCL: Lower Control Limit;
  • σ: process standard deviation.

In practice, the standard deviation of a process σ is almost always unknown, so, it must be estimated. For a random sample of the process X1, X2, …, Xn, σ can be estimated from the standard deviation of the sample (S). Conversely, when the control charts for variables are used in capability studies, σ can be estimated from ˉR/d2si32_e or ˉSsi10_e. The values of d2 can be found in Table O in the Appendix.

One of the limitations of the Cp index is that it only considers the process variability, ignoring its centralization (mean), which can result in incorrect conclusions as regards the process capability, since the process is not always centered on the mean.

As a general rule, the larger the Cp index, the lower the probability that the quality characteristic will be outside the specifications, reducing the probability of having defective products, as long as the mean is centered on the nominal value of the specification. According to Montgomery (2013), the evaluation of the Cp index can be interpreted as:

22.5.2 Cpk Index

While the Cp index compares the total variation allowed by the specification to the total variation of the process, without any measurement regarding the process mean, the Cpk index calculates the distance of the process mean (μ) from each one of the specification limits and chooses the smallest. If the process mean coincides with the nominal value of the specification, we have Cp = Cpk. The calculation of Cpk is given by:

Cpk=min(UCLμ3σ,μLCL3σ)

si151_e  (22.43)

where:

  • UCL: Upper Control Limit;
  • LCL: Lower Control Limit;
  • μ: process mean;
  • σ: process standard deviation.

In practice, the process mean μ and the standard deviation σ are almost always unknown, so, they must be estimated. For a random sample of the process X1, X2, …, Xn, μ and σ can be estimated from ˉXsi1_e and S, respectively. Conversely, when the control charts for variables are used, μ can be estimated from ̿Xsi6_e and σ from ˉR/d2si32_e or ˉSsi10_e.

Interpreting the Cpk index can be done in a similar way as the Cp index, as presented in Table 22.1.

Table 22.1

Interpreting the Cp Index According to the Reference Intervals
Value of CpNonconforming ItemsInterpretation
Cp < 1Above 2700Incapable process
1 ≤ Cp ≤ 1.33From 64 to 2700Acceptable process
Cp > 1.33Below 64Capable process

Source: Gonçalez, P.U., Werner, L., 2009. Comparação dos índices de capacidade do processo para distribuições não normais. Gestão Produção 16 (1), 121–132.

Usually, if Cp = Cpk, the process is centered on the specifications means, and when Cpk < Cp, the process is not centered on the mean (Montgomery, 2013).

22.5.3 Cpm and Cpmk Indexes

Cpm and Cpmk are alternatives to Cp and Cpk, respectively, because, besides the variability allowed in the process, they consider the distance of the process mean from the nominal value of the specification. Cpm can be calculated as:

Cpm=UCLLCL6τ=UCLLCL6σ2+(μT)2

si156_e  (22.44)

where:

  • UCL: Upper Control Limit;
  • LCL: Lower Control Limit;
  • μ: process mean;
  • σ: process standard deviation;
  • T: nominal value of the specification.

Analogous to the Cp index, an increase in the process variability increases the denominator of the Cpm index and, consequently, decreases its value. In addition to this, the larger the distance of the process mean from the nominal value of the specification, the smaller the Cpm will be.

While Cpm considers in its numerator only the variability allowed to the process, Cpmk considers the smallest distance between the process mean and the specification limits, analogous to indexes Cp and Cpk, respectively. The calculation of Cpmk is given by:

Cpmk=min{UCLμ3τ,μLCL3τ}=min{UCLμ3σ2+(μT)2,μLCL3σ2+(μT)2}

si157_e  (22.45)

where:

  • UCL: Upper Control Limit;
  • LCL: Lower Control Limit;
  • μ: process mean;
  • σ: process standard deviation;
  • T: nominal value of the specification.

Indexes Cpm and Cpmk coincide with indexes Cp and Cpk, respectively, when μ = T, and diminish as μ gets farther away from T.

Analogously, for a random sample of the process X1, X2, …, Xn, the mean μ and the standard deviation σ of indexes Cpm and Cpmk can be estimated from ˉXsi1_e and S, respectively. When the control charts for variables are used, μ can be estimated from ̿Xsi6_e and σ from ˉR/d2si32_e or ˉSsi10_e.

Example 22.7

For the data in Example 22.1, determine the percentage of nonconforming items, calculate indexes Cp, Cpk, Cpm, and Cpmk, and interpret the results for the following specification limits and nominal values:

  1. a) LCL = 13 mm, UCL = 16 mm and T = 14.5.
  2. b) LCL = 12 mm, UCL = 15 mm and T = 13.5.

Solution

To construct the ˉXsi1_e and R control charts in Example 22.1, the mean of the sample means and the mean of the sample ranges were calculated:

̿X=14.5417

si163_e

ˉR=0.9872

si164_e

Thus, to calculate the indexes, we will use ̿Xsi6_e and ˉR/d2si32_e as estimators of μ and σ, respectively. Through Table O in the Appendix, we obtain the value of constant d2 = 2.326 for n = 5.

  1. a) LCL = 13 mm, UCL = 16 mm and T = 14.5.

Based on the data found in Table 22.E.1, we can see that there are no items outside the specifications limits.

Indexes Cp, Cpk, Cpm, and Cpmk can be calculated as:

Cp=UCLLCL6σ=16136(ˉR/d2)=36×0.9872/2.326=1.178

si167_e

Cpk=min(UCLμ3σ,μLCL3σ)=min(1614.543×0.9872/2.326,14.54133×0.9872/2.326)=1.145

si168_e

Cpm=UCLLCL6σ2+(μT)2=16136(0.9872/2.326)2+(14.5414.5)2=1.172

si169_e

Cpmk=min{1614.543(0.9872/2.326)2+(14.5414.5)2,14.54133(0.9872/2.326)2+(14.5414.5)2}=1.140

si170_e

From the estimated mean of the process and the specification limits, we notice that the process is centered on the specifications mean. This can also be proven from the indexes calculated, since Cp ≅ Cpk and Cpm ≅ Cpmk. We can also see that Cp ≅ Cpm and Cpk ≅ Cpmk, since the process mean is much closer to the nominal value of the specification (μ ≅ T).

Since 1 ≤ Cp ≤ 1.33, the process is classified as acceptable. The same interpretation is valid for the other indexes.

  1. b) LCL = 12 mm, UCL = 15 mm, and T = 13.5.

Based on the data found in Table 22.E.1, we can see that 22.4% of the items are outside the specifications limits (above the upper specification limit). The calculations of the indexes are:

Cp=15126(ˉR/d2)=36×0.9872/2.326=1.178

si171_e

Cpk=min(1514.543×0.9872/2.326,14.54123×0.9872/2.326)=0.360

si172_e

Cpm=15126(0.9872/2.326)2+(14.5413.5)2=0.445

si173_e

Cpmk=min{1514.543(0.9872/2.326)2+(14.5413.5)2,14.54123(0.9872/2.326)2+(14.5413.5)2}=0.136

si174_e

Different from the previous case, the process is not centered on the specifications mean. This can also be proven from the calculated indexes, since Cpk < Cp and Cpmk < Cpm. Since the Cp index only considers the process variability, its value did not change, leading to incorrect interpretations.

We can also see that Cpm < Cp and Cpmk < Cpk, since the process mean differs from the nominal value of the specification (μ ≠ T).

The process is classified as incapable.

Solution Through SPSS Software

The data are available in the file Example_22.1.sav. Initially, we must follow the same steps for constructing the ˉXsi1_e and R control charts presented in Example 22.1. Once again, click on AnalyzeQuality ControlControl Charts..., define the option X-bar, R, s in Variables Charts and the option Cases are subgroups in Data Organization, select the variables of interest and click on the options X-bar using range and Display R chart (optional) in Charts, as shown in Figs. 22.5, 22.6, and 22.7. On Statistics..., define the specification limits: Upper, Lower and Target, select the desired Process Capability Indices (CP, CpK, and CpM). In addition, select the option Estimate using R-bar in Capability Sigma, as shown in Figs. 22.29 and 22.30. For case (a), the following specification limits were used: Upper (16), Lower (13), and Target (14.5), in accordance with Fig. 22.29. On the other hand, for case (b), the specification limits are: Upper (15), Lower (12), and Target (13.5), as shown in Fig. 22.30. To conclude, click on Continue and OK. Notice that SPSS does not provide the Cpkm index. The results for each case can be seen in Figs. 22.31 and 22.32.

Fig. 22.29
Fig. 22.29 Calculation of the process capability indexes (case a) on SPSS.
Fig. 22.30
Fig. 22.30 Calculation of the process capability indexes (case b) on SPSS.
Fig. 22.31
Fig. 22.31 Process capability statistics (case a) on SPSS.
Fig. 22.32
Fig. 22.32 Process capability statistics (case b) on SPSS.

We will not present the calculation of the capability indexes on Stata for this example. Since Stata only uses the standard deviation S as an estimator of σ, it does not offer the option ˉR/d2si32_e.

Example 22.8

Regarding Example 22.2, the process specifications are 8.82 ± 0.66. Determine the percentage of items that do not meet the specifications of the process. Obtain and interpret the indexes Cp, Cpk, Cpm, and Cpmk.

Solution

Based on Table 22.E.3, we can see that 7 of the 80 observations (8.75%) are outside the specifications limits.

To construct the ˉXsi1_e and S control charts in Example 22.2, the mean of the sample means and the mean of the sample standard deviation were calculated:

̿X=8.8574

si178_e

ˉS=0.1822

si179_e

that will be the estimators of μ and σ, respectively, to calculate the indexes Cp, Cpk, Cpm, and Cpmk.

We have UCL = 8.82 + 0.66 = 9.48 and LCL = 8.82 - 0.66 = 8.16. Therefore, indexes Cp, Cpk, Cpm, and Cpmk can be calculated as:

Cp=UCLLCL6σ=9.488.166×0.18=1.2077

si180_e

Cpk=min(UCLμ3σ,μLCL3σ)=min(9.488.863×0.18,8.868.163×0.18)=1.1394

si181_e

Cpm=UCLLCL6σ2+(μT)2=9.488.1660.182+(8.868.82)2=1.1831

si182_e

Cpmk=min{UCLμ3σ2+(μT)2,μLCL3σ2+(μT)2}=min{9.488.8630.182+(8.868.82)2,8.868.1630.182+(8.868.82)2}=1.1161

si183_e

Indexes Cp and Cpk, in addition to indexes Cpm and Cpmk, are relatively near, indicating that the process mean is relatively close to the center of the specification limits. We can also see that Cp ≅ Cpm and Cpk ≅ Cpmk, since the process mean is much closer to the specification target value (μ ≅ T). Since 1 ≤ Cp ≤ 1.33, the process is classified as acceptable. The same interpretation is valid for the other indexes.

Example 22.8 will be solved on Stata, since it uses the standard deviation S as an estimator of σ to calculate the capability indexes. However, it only provides the calculation of indexes Cp and Cpk. Even though SPSS also offers the estimation option using the ˉSsi10_e, its results are different when compared to the indexes above and to the results obtained on Stata.

Solution by Using Stata Software

To calculate indexes Cp and Cpk on Stata, we have to use the following command:

pciest mean sd, f(#) s(#)

where mean and sd are the estimates of μ and σ, respectively. On the other hand, f(#) and s(#) correspond to the lower and upper specification limits, respectively.

It is not necessary to open the file Example_22.2.dta to execute the command; however, we need to specify the function values. The command to be typed is, therefore:

pciest 8.857375 0.182157, f(8.16) s(9.48)

whose results can be seen in Fig. 22.33.

Fig. 22.33
Fig. 22.33 Results of indexes Cp and Cpk in Example 22.8 on Stata.

22.6 Final Remarks

Statistical Process Control (SPC) is made up of a set of tools whose main objective is to measure, monitor, control, and improve process quality. Control charts are an important SPC tool that monitor process variability throughout time.

Control charts can be divided into two major groups: control charts for variables, in which the quality characteristic is measured in a quantitative scale, and control charts for attributes, in which the quality characteristic is measured in a qualitative scale. Choosing the control chart must consider the size of the observations, how often the observations are collected, and the types of data collected in the process.

Despite the most common applications of control charts being in factories, more specifically in the control of processes, control charts are also being applied to monitor several businesses, including the control of sales forecasts, risks, financial planning, etc. (Carvalho, 2012).

22.7 Exercises

  1. 1) When producing ethanol from sugarcane, the quality characteristic to be evaluated is the percentage of sucrose in the sugarcane juice, whose specification limits vary between 15 and 18%. Hence, 20 samples were collected, each one of them with 4 observations, as shown in Table 22.2. The data are also available in the files Sucrose.sav and Sucrose.dta. The time interval between the samples is 45 minutes. We would like you to:

    Table 22.2

    Measurements of Sucrose in the Samples (%)
    SampleMeasurements
    m1m2m3m4
    116.2516.9615.2715.36
    215.2215.6814.7815.43
    316.3216.2016.8816.74
    415.5416.3116.8716.12
    516.5716.9317.1417.50
    617.6617.8717.9818.11
    717.1417.6417.8517.02
    816.3216.6415.1115.54
    915.2216.2416.5415.67
    1016.0116.4716.6917.22
    1117.2517.4417.6917.98
    1215.2415.9816.5117.12
    1315.6916.8716.5115.02
    1415.3914.8815.9416.12
    1515.2715.6916.3315.87
    1616.8817.1717.6818.12
    1717.2517.0917.3616.47
    1816.8517.3117.2617.84
    1917.1217.3917.8316.14
    2015.1915.2415.8716.68

    t0015

    1. a) Determine the control limits for the mean and for the range, and check if the process is in control.
    2. b) Calculate indexes Cp, Cpk, Cpm, and Cpkm and interpret the results.
  2. 2) Once again consider the data from the previous exercise. We would like you to:
    1. a) Determine the control limits for the mean and for the standard deviation, and check if the process is in control.
    2. b) Recalculate indexes Cp and Cpk using ˉSsi10_e as an estimator of σ, and interpret the results.
  3. 3) When producing beer, we use cereal grains and yeast as raw materials. The quality characteristic analyzed is the width of the yeast whose specification limits vary between 5 and 7 μm. Table 22.3 shows the data from 20 samples, each one of them with 4 observations. The data are also available in the files Yeast.sav and Yeast.dta. We would like you to:

    Table 22.3

    Width of the Yeast in μm
    SampleMeasurements
    m1m2m3m4
    15.125.645.876.11
    26.446.987.146.24
    36.516.876.105.87
    45.545.685.985.14
    55.145.875.666.24
    66.326.576.986.17
    75.545.145.984.98
    85.125.675.996.20
    96.136.886.947.01
    105.566.125.666.25
    116.595.255.756.44
    125.885.745.966.34
    136.146.876.935.87
    145.505.645.786.50
    155.665.986.246.32
    166.546.987.135.89
    175.215.115.665.74
    185.745.895.666.31
    195.895.996.476.25
    206.116.286.556.87

    t0020

    1. a) Determine the control limits by using the ˉXsi1_e and R charts, and interpret the results.
    2. b) Calculate indexes Cp, Cpk, Cpm, and Cpkm and interpret the results.
  4. 4) Once again consider the data from the previous exercise. We would like you to:
    1. a) Determine the control limits by using the ˉXsi1_e and S charts, and interpret the results.
    2. b) Recalculate indexes Cp and Cpk using ˉSsi10_e as an estimator of σ, and interpret the results.
  5. 5) The data shown in Table 22.4 refer to the number of defective products in each one of the 25 samples collected, size 50. The time interval between the samples is 2 hours. Calculate the control limits and check if the process is in statistical control.

    Table 22.4

    Number of Defective Products in Each Sample
    Sample NumberNumber of Defective Items
    14
    26
    33
    47
    53
    62
    71
    84
    95
    103
    112
    126
    132
    144
    152
    163
    174
    186
    195
    203
    212
    221
    231
    242
    254
  6. 6) From the data in the previous example, construct the np chart and check if the process is in control.
  7. 7) A toy company wishes to control the number of small defects in a certain type of bicycle. For a sample with 40 bicycles, the number of defects per bicycle was computed, as shown in Table 22.5. Construct the most suitable control chart and check if the process is in control.

    Table 22.5

    Number of Defects per Bicycle
    BicycleDefects per BicycleBicycleDefects per Bicycle
    18216
    26227
    34236
    45245
    57258
    60267
    76274
    84283
    97296
    105309
    119312
    120320
    137331
    145347
    156355
    163364
    178376
    185388
    196393
    205404

    t0030

  8. 8) An electrical appliance company wants to control the quantity of small defects in all of its production of a certain vacuum cleaner. Every hour, the amount of vacuum cleaners produced is selected and the number of defects per sample is computed, as shown in Table 22.6. Construct the most suitable control chart and check if the process is in control.

    Table 22.6

    Number of Defects per Vacuum Cleaner
    Sample iSample SizeDefects per Sample
    13035
    22431
    33740
    42219
    52732
    62615
    73042
    82127
    92548
    103642
    114154
    123839
    134762
    143627
    152925
    163439
    174043
    184049
    193738
    203639
    213441
    223343
    235150
    244449

References

Carvalho N.A.S. Aplicação de Modelos Estatísticos para Previsão e Monitoramento da Cobrabilidade de uma Empresa de Distribuição de Energia Elétrica no Brasil. Pontifícia Universidade Católica do Rio de Janeiro; 2012 Dissertação (Mestrado em Metrologia).

Gonçalez P.U., Werner L. Comparação dos índices de capacidade do processo para distribuições não normais. Gestão & Produção. 2009;16(1):121–132.

Montgomery D.C. Introduction to Statistical Quality Control. seventh ed. Arizona State University: John Wisley & Sons, Inc; 2013.

Pylro A.S. Modelo Linear Dinâmico de Harrison & Stevens Aplicado ao Controle Estatístico de Processos Autocorrelacionados. Pontifícia Universidade Católica do Rio de Janeiro; 2008 Tese (Doutorado em Engenharia de Produção).

Sharpe N.R., de Veaux R.D., Velleman P.F. Business Statistics. third ed. Pearson Education; 2015.


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