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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Author Krishnendu Chakrabarty , Sandeep K. Goel
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as ....
Release Date 2017/12